Influence of annealing time on structural, morphological properties of TiO2 Films prepared by pulsed laser deposition

Abstract

TiO2 films were fabricated by pulsed laser deposition (PLD) on glass substrates. XRD and AFM were used to study structural and surface morphology. XRD chart revelled steady increments of the intensity of the main peak of TiO2 of the films with the increase of laser power. The piratical sizes of the film were 43.10nm. The Atomic Force Microscope images show that surface roughness of the films was improved with the increase of laser energy. These results propose the possibility to enhance the structural properties of the TiO2 films and also it is possible to obtain high quality TiO2 film by variation of power laser.